A powerful spectrometer tells both wavelength and spectra

X-WAVE is a high throughput Fourier Transform VIS/NIR spectrometer. Based on a patent pending design, the X-WAVE utilizes a very tiny piece of birefrigent crystal to create a high quality interferogram for any kind of input. Using a high performance line scan CCD camera, we are able to get instantaneuos information about the wavelength(0.001nm resolution and 0.01nm accuracy) and spectra(5nm resolution) of the input light sources.

 

Features High throughput design For any kind of polarization input Wavelength mode (for <10GHz bandwidth input): 0.001nm resolution and 0.01nm accuracy Spectral reolution: 5nm integration time 10 micro second to seconds Standard spectral response 380nm-1100nm Low cost for only $8888